 EDX 880, a specialized precious metals tester, is capable of measuring inner walls of the jewelries and other irregular samples.
Applications
Mainly used for testing precious metals; also applicable to plating thickness and RoHS testing
Fields requiring analysis of precious metals by X-ray Fluorescence Spectrometry
Jewelry stores and other places
Added inner wall test and micro area test functions
Performance characteristics
Large power X-ray tube
Super large window proportional counter
Elegant and eye-catching curved design,
Large sample chamber houses large samples
Multiple sample holding ways (universal sample clamp, sample plate, plasticine), offering common tests, inner wall tests and irregular samples tests
Manual lift platform offers tests of samples of different thicknesses
Small collimator enables the test of micro area
Laser positioning CCD positions the test spot visually and accurately. The laser automatically stops when the measurement starts, which helps taking clearer pictures.
Good radiation shielding capability guarantees the safety of the operators
The measurement can be observed through the transparent cover. | Specifications | Model | EDX 880, energy dispersive precious metals and plating thickness analyzer | Detector | Proportional counter or Si-PIN detector | Excitation source | 50W X-ray tube | | Tube current | 50-1000 µA | Tube voltage | 5-50 kV | | Test time | 60-100 s | | Measured elements | Au, Ag, Pt, Pd, Cu, Zn, Ni, Rh, Cd, Ru etc. | | Measurement repeatibility | 0,05% ~0,1% (main element content more than 96%)
0,01 µm ~0,05 µm (for coating element analysis) | Sample positioning | Laser positioning device, CCD camera | Power | 220 VAC +/- 5V (recommended stabilized voltage power supply) | Collimators | 0,1 mm collimator enabling micro area tests | Ambient temperature | +5 °C to + 30 °C | Ambient humidity | not less than 70% | Standard configurations | Single sample chamber, high resolution CCD, manual lift sample platform, amplifier circuit, , 50 W x-ray tube, high sensitive signal detection circuit, universal sample clamp, plasticine, collimator. |
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| This specification can be changed without prior notice. |
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