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edx3600b_3EDX3600B X-ray Fluorescence spectrometer uses XRF technology for rapid and accurate elemental analysis of cement and steel.  As spectrum decoupling technique is used, the original spectrum can be easily decoupled, and the measured analytical precision of light elements of Si, S, Al, etc is the same. Owing to multi-parameter linear regression method, the absorption and enhancement effects between elements are significantly reduced.

Applications

Mainly used for full-element analysis in cement and mineral industry
Plating thickness measurement and RoHS testing
Fields requiring analysis of precious metals by X-ray Fluorescence Spectrometry
Electronic and Electric Appliances (RoHS)
Toy & Ceramics
Metallurgy & Minerals

 

 



Performance characteristics

Delivers professional full-element analysis of cement, steel, minerals, plating thickness and hazardous elements (RoHS).
The technology features low-energy X-rays with good excitation results of light elements such as Si, S, Na and Mg.
The instrument is equipped with UHRD detector as well, which leads to good energy linearity, energy resolution, spectrum property and high peak-background ratio.
Due to automatic spectrum stabilizing device, the instrument is in great consistency.
In-built SNE improves the signal processing ability up to 25 times.
The collimators and filters can be switched automatically for different samples.
Electric-cooling UHRD detector instead of liquid nitrogen cooling detector
Intelligent full-element analysis software matches with the hardware well

Specifications

Model

EDX 3600B, professional EDXRF Spectrometer for full-element analysis

Detector

Si-PIN detector electrically cooled, UHRD technology

Excitation source

Tungsten X-ray tube,

Tube current

50-1000 µA

Tube voltage

5-50 kV

Test time

60-200 s

Measured elements

From Na to U, improved precision for light elements

Analysis range

1 ppm - 99,99%

Measurement precision

0,05%

Simultaneous analysis

24 elements

Forms of samples

solid, powder and liquid

Measured layers

11 layers, up to 0,005 µm thick

Sample positioning

High resolution CCD camera 1,4 mln pix.

Collimators

Collimators and filters can be switched automatically for different samples.

Power

110/220 VAC +/- 5V (recommended stabilized voltage power supply)

Energy resolution

150 +/- 5 eV

Ambient temperature

+15 °C to + 30 °C

Ambient humidity

35% - 70%

Sample chamber dimensions

320 mm dia. x180 mm h.

Weight

75 kg

Standard configurations

Single vacuum sample chamber, high resolution CCD, Si-PIN UHRD detector, light path enhancement system, Signal-to-Noise Enhancer (SNE), Automatic collimator and filter switch, Precise mobile platform, Enhanced metal sensitivity analyzer, full-element analytical software.

 

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This specification can be changed without prior notice.

 

EnviSense | Non-destructive mineral analysis | XRF spectrometers | EDXRF | xrf alloy grade analyzer | Skyray | EDX3600B |

 
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