EDX3000 incorporates Skyray’s years of experience in precious metal testing with its unique product configurations and fully functional software. Its ergonomically design and friendly software interfaces grant the users a simple measurement job.
Applications
Mainly used for testing precious metals; also applicable to plating thickness and RoHS testing
Fields requiring analysis of precious metals by X-ray Fluorescence Spectrometry Jewelry stores and other places Added inner wall test and micro area test functions Au, Ag, Pt, Pd, Cu, Zn, Ni, etc. Electronic and Electric Appliances (RoHS) Toy & Ceramics Metallurgy & Minerals
Performance characteristics
Stable X-ray tube Electric-cooling Si-Pin detector instead of liquid nitrogen cooling detector Skyray patent product-Signal-to-Noise Enhancer (SNE) improves the stability and accuracy of the measurement greatly. In-built high resolution camera, convenient for users to analyze samples at any moment Digital pulse processor handles the data rapidly and accurately Amplifier circuit High and low voltage power Single sample chamber, open and close manually, safe and convenient Non-vacuum Chamber Triple safety protection mode Multi-variant non-linear regression procedure independent matrix effect correction model Overall steel structure; elegant and fashionable Specially developed software with friendly interface Accurate measurement even when no standard sample Timely display of high definition graphs, carefree measurement
Movie presentation
Specifications
Model
EDX 3000, energy dispersive precious metals and plating thickness analyzer
Detector
Si-PIN detector
Excitation source
X-ray tube
Tube current
50-1000 µA
Tube voltage
5-50 kV
Test time
60-200 s
Measured elements
Au, Ag, Pt, Pd, Cu, Zn, Ni, Rh, Cd, Ru etc. from S to U
Analysis range
1 ppm - 99,99%
Measurement precision
0,05% (main element content more than 96%)
Simultaneous analysis
24 elements
Forms of samples
solid, powder and liquid
Sample positioning
Laser positioning device, CCD camera
Power
110/220 VAC +/- 5V (recommended stabilized voltage power supply)
Energy resolution
155 +/- 5 eV
Ambient temperature
+15 °C to + 30 °C
Ambient humidity
35% - 70%
Sample chamber dimensions
310x300x100 mm
Weight
30 kg
Standard configurations
Single sample chamber, high resolution CCD, Si-PIN detector, amplifier circuit, , 50 W x-ray tube, high sensitive signal detection circuit, Signal to Noise Enchancer, MCA
This specification can be changed without prior notice.
