Xenemetrix Precious Metal Analyzer (X-PMA) is a non-destructive technique that can easily identify and quantify the presence of various elements such as gold, platinum, silver and other precious and base metals present in jewelry, coins and other forms. Analysis is often achieved within a matter of minutes. Solid samples as small as 2 centimeters can also be analyzed. Essential advantages of using XRF are the high reproducibility, precision, high accuracy and its ability to give the same as or nearly as good as quantification as fire assay - without destroying the sample
Specifications | | Description | Bench Top, 50kV, 50Watt, 160eV +/-10eV PIN Diode@5,9 keV and 10.000cps output, 2 sets of primary beam filters positions EDXRF system | | Series | Ex-2600 | | Model | PMA analyzer High Powered Benchtop EDXRF | | Intended Applications | Precious metals | | X-ray Source | 50kV, 50 Watt, W Anode | | Anode options | Mo | | HV Power Supply | 50 kV, 4000 μA | | Supply Voltage | 110 or 220, plug type | | Controller | EX-2600H Controller | | Filter/Collimator Series | 2 sets of filter positions | | Detector | PIN Diode 160eV +/- 10eV Resolution | | Counting Electronics | Analog/Digital Pulse Processing (ADPP) | | Sample Presentation System | 1 Positiion | | Safety Systems | Standard Xenemetrix - Lid Microswitches and X-Ray On Light | | Computer Specifications | Integrated computer | | CPU | Pentium 4 or better | | RAM | 512 MB | | Hard Drive | 80 GB or higher | | Software Specifications | nEXt | | Operation System | WIN XP | | Camera | CCD | | Energy Calibration Standards | 4; Ti, Cu, Sn | | | This specification can be changed without prior notice
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