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EDXRF Spectrometers
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ED3000D EDXRF Spectrometer
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Product description
Performance characteristics
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More accurate testing results are the persistent pursuit of Skyray. They keep firmly in mind that their mission is to provide the users with the best service.
The newly developed EDX 3000D originates from this idea. It is embedded with the five characteristics “accurate, rapid, non-destructive, intuitive and environment-friendly” of Skyray EDX series spectrometers. Added with Skyray patented SNE, the instrument delivers test results in improved accuracy.
Electric-cooling Si-PIN semiconductor detector, free of liquid nitrogen cooling
Automatic filter selection and automatic collimator switch
Triple safety protection mode
Independent matrix effect correction model
Multi-variable non-linear regression procedure
Automatic open and close of sample chamber
Software positions sample platform and minimum displacement is 0.01mm
Automatic collimator and filter switch for different samples
Specially developed measurement software, with user friendly operation interface
Inbuilt high resolution CCD, convenient for users to analyze samples at any moment
Attractive and fashionable design impacts you visually
Precise automatic movable platform, which adjusts the position of sample more accurately and conveniently
Skyray patented Signal-to-Noise Enhancer (SNE) improves the certainty and accuracy of measurement greatly.
Newly developed sample positioning system, coordinated with automatic movable platform, realizes spot measurement with one mouse click
With a click on the sample, EDX 3000D moves to the point for test. |
Applications |
Detecting hazardous substances in Electric and electronics industries, electroplating industries, various materials, plastics, wood, glass and others
Detection for electroplating industries
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| Specifications |
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Model
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EDX 3000D, EDXRF RoHS and Full-element analyzer
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Detector
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SI-PIN electrically cooled
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Excitation source
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X-ray tube
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| Tube voltage |
5-50 kV |
| Tube current |
50-1000μA |
| Energy resolution |
155±5eV
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| Measured elements |
from S to U; 24 elements measured simultaneously
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| Measurement range |
1 ppm - 99,9%; detection limit of Cd/Pb/Cr/Hg/Br reaches 1ppm
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Measurement time
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60-200 s.
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Power
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220 VAC +/- 5V (recommended stabilized voltage power supply)
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Size of sample chamber
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3-D superlarge chamber dia 450mm×90mm
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| Weight |
110 kg |
| Standard configuration |
Movable sample platform; enhanced metal element sensitivity analyzer, amplifier circuit; signal-to-noise enhancer. |
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This specification can be changed without prior notice.
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