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Gold analysers (XRF) |
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EDX3000 XRF Spectrometer |
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Product description |
Instrument introduction EDX3000 incorporates Skyray’s years of experience in precious metal testing with its unique product configurations and fully functional software. Its ergonomically design and friendly software interfaces grant the users a simple measurement job. Performance characteristics Stable X-ray tube |
Applications |
Mainly used for testing precious metals; also applicable to plating thickness and RoHS testing |
| Specifications | |
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Model |
EDX 3000, energy dispersive precious metals and plating thickness analyzer |
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Detector |
Si-PIN detector |
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Excitation source |
X-ray tube |
| Tube current | 50-1000 µA |
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Tube voltage |
5-50 kV |
| Test time |
60-200 s |
| Measured elements |
Au, Ag, Pt, Pd, Cu, Zn, Ni, Rh, Cd, Ru etc. from S to U |
| Analysis range | 1 ppm - 99,99% |
| Measurement precision |
0,05% (main element content more than 96%) |
| Simultaneous analysis | 24 elements |
| Forms of samples | solid, powder and liquid |
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Sample positioning |
Laser positioning device, CCD camera |
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Power |
110/220 VAC +/- 5V (recommended stabilized voltage power supply) |
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Energy resolution |
155 +/- 5 eV |
| Ambient temperature | +15 °C to + 30 °C |
| Ambient humidity | 35% - 70% |
| Sample chamber dimensions | 310x300x100 mm |
| Weight | 30 kg |
| Standard configurations | Single sample chamber, high resolution CCD, Si-PIN detector, amplifier circuit, , 50 W x-ray tube, high sensitive signal detection circuit, Signal to Noise Enchancer, MCA |
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This specification can be changed without prior notice. |







